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Next generation HALT and HASS : robust design of electronics and systems /

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מידע ביבליוגרפי
Main Authors:	Gray, Kirk (Author), Paschkewitz, John James (Author)
פורמט:	אלקטרוני ספר אלקטרוני
שפה:	אנגלית
יצא לאור:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
סדרה:	Wiley series in quality and reliability engineering.
נושאים:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
גישה מקוונת:	An electronic book accessible through the World Wide Web; click to view
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!

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