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Next generation HALT and HASS : robust design of electronics and systems /

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Detalles Bibliográficos
Main Authors:	Gray, Kirk (Author), Paschkewitz, John James (Author)
Formato:	Electrónico eBook
Idioma:	inglés
Publicado:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Series:	Wiley series in quality and reliability engineering.
Subjects:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Acceso en liña:	An electronic book accessible through the World Wide Web; click to view
Tags:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

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