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Next generation HALT and HASS : robust design of electronics and systems /

Sábháilte in:

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Gray, Kirk (Údar), Paschkewitz, John James (Údar)
Formáid:	Leictreonach Ríomhleabhar
Teanga:	Béarla
Foilsithe / Cruthaithe:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Sraith:	Wiley series in quality and reliability engineering.
Ábhair:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Rochtain ar líne:	An electronic book accessible through the World Wide Web; click to view
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

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Failure analysis a practical guide for manufacturers of electronic components and systems /
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Structural life assessment methods
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Engines of discovery a century of particle accelerators /
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ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
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ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
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ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
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ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
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ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
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ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
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ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
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ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
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ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
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