Next generation HALT and HASS : robust design of electronics and systems /
Αποθηκεύτηκε σε:
Κύριοι συγγραφείς: | Gray, Kirk (Συγγραφέας), Paschkewitz, John James (Συγγραφέας) |
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Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | Αγγλικά |
Έκδοση: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
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Σειρά: | Wiley series in quality and reliability engineering.
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Θέματα: | |
Διαθέσιμο Online: | An electronic book accessible through the World Wide Web; click to view |
Ετικέτες: |
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από: McLean, Harry W., 1946-
Έκδοση: (2009) -
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