Delwedd Flaen

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Next generation HALT and HASS : robust design of electronics and systems /

Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Prif Awduron:	Gray, Kirk (Awdur), Paschkewitz, John James (Awdur)
Fformat:	Electronig eLyfr
Iaith:	Saesneg
Cyhoeddwyd:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Cyfres:	Wiley series in quality and reliability engineering.
Pynciau:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Mynediad Ar-lein:	An electronic book accessible through the World Wide Web; click to view
Tagiau:	Ychwanegu Tag Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

Eitemau Tebyg

HALT, HASS, and HASA explained : accelerated reliability techniques /
gan: McLean, Harry W., 1946-
Cyhoeddwyd: (2009)

Accelerated testing and validation testing, engineering, and management tools for lean development /
gan: Porter, Alex
Cyhoeddwyd: (2004)

A designer's guide to built-in self-test
gan: Stroud, Charles E.
Cyhoeddwyd: (2002)

Introduction of intelligent machine fault diagnosis and prognosis
gan: Yang, O-Suk
Cyhoeddwyd: (2009)

Accelerated reliability and durability testing technology
gan: Klyatis, Lev M.
Cyhoeddwyd: (2012)

Failure analysis a practical guide for manufacturers of electronic components and systems /
gan: Bâzu, M. I. (Marius I.), 1948-
Cyhoeddwyd: (2011)

System-on-a-chip design and test /
gan: Rajsuman, Rochit
Cyhoeddwyd: (2000)

Structural life assessment methods
gan: Liu, A. F.
Cyhoeddwyd: (1998)

Design and test of digital circuits by quantum-dot cellular automata
Cyhoeddwyd: (2008)

Engines of discovery a century of particle accelerators /
gan: Sessler, A. M. (Andrew Marienhoff)
Cyhoeddwyd: (2007)

Boundary-scan interconnect diagnosis
gan: Sousa, José T. de
Cyhoeddwyd: (2001)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Cyhoeddwyd: (2006)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Cyhoeddwyd: (2001)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Cyhoeddwyd: (1998)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Cyhoeddwyd: (2008)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Cyhoeddwyd: (2002)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2007)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Cyhoeddwyd: (2000)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Cyhoeddwyd: (1999)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Cyhoeddwyd: (2005)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Cyhoeddwyd: (2004)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Cyhoeddwyd: (2003)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Cyhoeddwyd: (2010)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Cyhoeddwyd: (1997)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Cyhoeddwyd: (1996)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2009)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Cyhoeddwyd: (2014)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Cyhoeddwyd: (2012)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Cyhoeddwyd: (2011)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Cyhoeddwyd: (2015)

Design for at-speed test, diagnosis, and measurement
Cyhoeddwyd: (2000)

Designing quality authentic assessments /
gan: Tay, Hui Yong
Cyhoeddwyd: (2018)

An introduction to TTCN-3
Cyhoeddwyd: (2011)

Power electronics design a practitioner's guide /
gan: Sueker, Keith H.
Cyhoeddwyd: (2005)

Systems failure analysis
gan: Berk, Joseph, 1951-
Cyhoeddwyd: (2009)

Antenna design for mobile devices
gan: Zhang, Zhijun, 1971-
Cyhoeddwyd: (2011)

Building dependable distributed systems /
gan: Zhao, Wenbing, Ph.D
Cyhoeddwyd: (2014)

A practitioner's guide to software test design
gan: Copeland, Lee
Cyhoeddwyd: (2004)

Structured electronic design negative-feedback amplifiers /
Cyhoeddwyd: (2003)