Next generation HALT and HASS : robust design of electronics and systems /

Gorde:

Xehetasun bibliografikoak
Egile Nagusiak:	Gray, Kirk (Egilea), Paschkewitz, John James (Egilea)
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Saila:	Wiley series in quality and reliability engineering.
Gaiak:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Sarrera elektronikoa:	An electronic book accessible through the World Wide Web; click to view
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Deskribapena
Deskribapen fisikoa:	1 online resource (299 pages) : illustrations (some color)
Bibliografia:	Includes bibliographical references and index.
ISBN:	9781118700204 (e-book)

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