Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday /

में बचाया:

ग्रंथसूची विवरण
अन्य लेखक:	Nakamura, Syouji, Qian, Cun Hua, Chen, Mingchih
स्वरूप:	इलेक्ट्रोनिक ई-पुस्तक
भाषा:	अंग्रेज़ी
प्रकाशित:	New Jersey : World Scientific, [2014]
विषय:	Reliability (Engineering) Stochastic systems. Electronic books.
ऑनलाइन पहुंच:	An electronic book accessible through the World Wide Web; click to view
टैग:	टैग जोड़ें कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!

MARC


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245	0	0	\|a Reliability modeling with applications : \|b essays in honor of Professor Toshio Nakagawa on his 70th Birthday / \|c editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan.
264		1	\|a New Jersey : \|b World Scientific, \|c [2014]
264		4	\|c ©2014
300			\|a 1 online resource (379 pages) : \|b illustrations
336			\|a text \|2 rdacontent
337			\|a computer \|2 rdamedia
338			\|a online resource \|2 rdacarrier
504			\|a Includes bibliographical references.
588			\|a Description based on online resource; title from PDF title page (ebrary, viewed February 5, 2014).
590			\|a Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
650		0	\|a Reliability (Engineering)
650		0	\|a Stochastic systems.
655		0	\|a Electronic books.
700	1		\|a Nakamura, Syouji.
700	1		\|a Qian, Cun Hua.
700	1		\|a Chen, Mingchih.
797	2		\|a ebrary.
856	4	0	\|u http://site.ebrary.com/lib/daystar/Doc?id=10832740 \|z An electronic book accessible through the World Wide Web; click to view
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