Yablon, D. G. (2014). Scanning probe microscopy for industrial applications: Nanomechanical characterization. Wiley.
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Chicago Style (17th ed.) Citation
Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Hoboken, New Jersey: Wiley, 2014.
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MLA引文
Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, 2014.
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警告：這些引文格式不一定是100％准確.