Tohutoro APA (7th ed.)
Yablon, D. G. (2014). Scanning probe microscopy for industrial applications: Nanomechanical characterization. Wiley.
Tohutoru Kātū Chicago (17th ed.)
Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Hoboken, New Jersey: Wiley, 2014.
Tohutoro MLA (9th ed.)
Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, 2014.
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