Defects and diffusion in semiconductors XIII /

Defects and diffusion in semiconductors. an annual retrospective /
Опубликовано: (2008)

Defects and diffusion, theory and simulation : an annual retrospective I /
Опубликовано: (2009)

Defects and diffusion, theory and simulation : an annual retrospective II /
Опубликовано: (2010)

Defects and diffusion, theory and simulation : an annual retrospective I /
Опубликовано: (2009)

Defects and diffusion, theory and simulation : an annual retrospective II /
Опубликовано: (2010)

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Опубликовано: (2012)

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Опубликовано: (2012)

Electron paramagnetic resonance studies of point defects in AlGaN and SiC /
по: Trinh, Xuan Thang
Опубликовано: (2015)

Electron paramagnetic resonance studies of point defects in AlGaN and SiC /
по: Trinh, Xuan Thang
Опубликовано: (2015)

Diffusion in semiconductors, other than silicon : compilation /
Опубликовано: (2010)

Diffusion in semiconductors, other than silicon : compilation /
Опубликовано: (2010)

Defects and diffusion in metals : an annual retrospective XI /
Опубликовано: (2009)

Defects and diffusion in metals : an annual retrospective X /
Опубликовано: (2008)

Defects and diffusion in metals : an annual retrospective IX /
Опубликовано: (2007)

Defects and diffusion in metals : an annual retrospective XI /
Опубликовано: (2009)

Defects and diffusion in metals : an annual retrospective X /
Опубликовано: (2008)

Defects and diffusion in metals : an annual retrospective IX /
Опубликовано: (2007)

Defects and diffusion, theory and simulation : an annual retrospective III /
Опубликовано: (2012)

Defects and diffusion, theory and simulation : an annual retrospective III /
Опубликовано: (2012)

Defects and diffusion in ceramics XIII : an annual retrospective XIII /
Опубликовано: (2012)

Defects and diffusion in ceramics XIII : an annual retrospective XIII /
Опубликовано: (2012)

Diffusion and defects in TiO2 : a compilation /
Опубликовано: (2013)

Diffusion and defects in TiO2 : a compilation /
Опубликовано: (2013)

Radiation defect engineering
по: Kozlovskiĭ, V. V. (Vitaliĭ Vasilʹevich)
Опубликовано: (2005)

Radiation defect engineering
по: Kozlovskiĭ, V. V. (Vitaliĭ Vasilʹevich)
Опубликовано: (2005)

Functionalization of semiconductor surfaces
Опубликовано: (2012)

Functionalization of semiconductor surfaces
Опубликовано: (2012)

Semiconductor physics and devices : basic principles /
по: Neamen, Donald A.
Опубликовано: (2003)

Semiconductor physics and devices : basic principles /
по: Neamen, Donald A.
Опубликовано: (2012)

Semiconductor physics and devices : basic principles /
по: Neamen, Donald A.
Опубликовано: (2003)

Semiconductor physics and devices : basic principles /
по: Neamen, Donald A.
Опубликовано: (2003)

Semiconductor physics and devices : basic principles /
по: Neamen, Donald A.
Опубликовано: (2003)

Semiconductor physics and devices : basic principles /
по: Neamen, Donald A.
Опубликовано: (2012)

Semiconductor macroatoms basic physics and quantum-device applications /
Опубликовано: (2005)

Semiconductor macroatoms basic physics and quantum-device applications /
Опубликовано: (2005)

Reliability and radiation effects in compound semiconductors
по: Johnston, Allan
Опубликовано: (2010)