Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /

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Ente Autore: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan
Altri autori: Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science)
Natura: Elettronico Atti del Convegno eBook
Lingua:inglese
Pubblicazione: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
Serie:Materials science forum ; v. 725.
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Accesso online:An electronic book accessible through the World Wide Web; click to view
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