Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Gardado en:
| Autor Corporativo: | |
|---|---|
| Outros autores: | , |
| Formato: | Electrónico Conference Proceeding eBook |
| Idioma: | inglés |
| Publicado: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
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| Series: | Materials science forum ;
v. 725. |
| Subjects: | |
| Acceso en liña: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
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