Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
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Соавтор: | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan |
---|---|
Другие авторы: | Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science) |
Формат: | Электронный ресурс Материалы конференции eКнига |
Язык: | английский |
Опубликовано: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
Серии: | Materials science forum ;
v. 725. |
Предметы: | |
Online-ссылка: | An electronic book accessible through the World Wide Web; click to view |
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