Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Gorde:
Erakunde egilea: | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan |
---|---|
Beste egile batzuk: | Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science) |
Formatua: | Baliabide elektronikoa Konferentzia-aktak eBook |
Hizkuntza: | ingelesa |
Argitaratua: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
Saila: | Materials science forum ;
v. 725. |
Gaiak: | |
Sarrera elektronikoa: | An electronic book accessible through the World Wide Web; click to view |
Etiketak: |
Etiketa erantsi
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
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