Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
Guardat en:
Autor corporatiu: | International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki-shi, Japan |
---|---|
Altres autors: | Yamada-Kaneta, Hiroshi, Sakai, Akira (Professor of engineering science) |
Format: | Electrònic Actes de congresos eBook |
Idioma: | anglès |
Publicat: |
Durnten-Zurich ; Enfield, NH :
Trans Tech Publications,
[2012]
|
Col·lecció: | Materials science forum ;
v. 725. |
Matèries: | |
Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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