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Electrical overstress (EOS) devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...

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Detalles Bibliográficos
Autor principal:	Voldman, Steven H.
Autor Corporativo:	ebrary, Inc
Formato:	Electrónico eBook
Lenguaje:	inglés
Publicado:	Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
Colección:	ESD series
Materias:	Semiconductors > Failures. Semiconductors > Protection. Transients (Electricity) Overvoltage. Electronic books.
Acceso en línea:	An electronic book accessible through the World Wide Web; click to view
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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