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Electrical overstress (EOS) devices, circuits and systems /

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...

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Opis bibliograficzny
1. autor:	Voldman, Steven H.
Korporacja:	ebrary, Inc
Format:	Elektroniczne E-book
Język:	angielski
Wydane:	Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014.
Seria:	ESD series
Hasła przedmiotowe:	Semiconductors > Failures. Semiconductors > Protection. Transients (Electricity) Overvoltage. Electronic books.
Dostęp online:	An electronic book accessible through the World Wide Web; click to view
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

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