Electrical overstress (EOS) devices, circuits and systems /
"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a...
में बचाया:
| मुख्य लेखक: | |
|---|---|
| निगमित लेखक: | |
| स्वरूप: | इलेक्ट्रोनिक ई-पुस्तक |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2014.
|
| श्रृंखला: | ESD series
|
| विषय: | |
| ऑनलाइन पहुंच: | An electronic book accessible through the World Wide Web; click to view |
| टैग: |
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