ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Опубликовано: (2006)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Опубликовано: (2010)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Опубликовано: (2011)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Опубликовано: (2002)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Опубликовано: (1998)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Опубликовано: (2007)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Опубликовано: (2013)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Опубликовано: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Опубликовано: (1997)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Опубликовано: (2009)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Опубликовано: (2008)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Опубликовано: (2014)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Опубликовано: (2015)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Опубликовано: (2000)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Опубликовано: (2012)

Electronic materials science
по: Irene, Eugene A.
Опубликовано: (2005)

A designer's guide to built-in self-test
по: Stroud, Charles E.
Опубликовано: (2002)

Polymers for electricity and electronics materials, properties, and applications /
по: Drobny, Jiri George
Опубликовано: (2012)

Parts selection and management
Опубликовано: (2004)

Microelectronic failure analysis desk reference.
Опубликовано: (2002)

Microelectronics failure analysis desk reference /
Опубликовано: (2011)

Design for at-speed test, diagnosis, and measurement
Опубликовано: (2000)

Microelectronic failure analysis desk reference : 2001 supplement /
Опубликовано: (2001)

Electrical characterization of organic electronic materials and devices
по: Stallinga, Peter, 1966-
Опубликовано: (2009)

Solid state electronic devices /
по: Streetman, Ben G.
Опубликовано: (2010)

Single-electron devices and circuits in silicon
по: Durrani, Zahid Ali Khan
Опубликовано: (2010)

Boundary-scan interconnect diagnosis
по: Sousa, José T. de
Опубликовано: (2001)

Failure analysis a practical guide for manufacturers of electronic components and systems /
по: Bâzu, M. I. (Marius I.), 1948-
Опубликовано: (2011)

Electronic components and processes
по: Maheshwari, Preeti
Опубликовано: (2006)

Guide to state-of-the-art electron devices
Опубликовано: (2013)

Novel architectures for flexible electrochemical devices and systems
по: Kawahara, Jun
Опубликовано: (2013)

Polymers for electronic components a Rapra industry analysis report /
по: Cousins, Keith
Опубликовано: (2001)

Electronic : devices and circuits /
по: Kulshreshtha, D. c.
Опубликовано: (2006)

ESD circuits and devices /
по: Voldman, Steven H.
Опубликовано: (2006)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
по: Karris, Steven T.
Опубликовано: (2012)

Digital rubbish natural history of electronics /
по: Gabrys, Jennifer
Опубликовано: (2011)