ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Awduron Corfforaethol: International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Fformat: Electronig Trafodyn Cynhadledd eLyfr
Iaith:Saesneg
Cyhoeddwyd: Materials Park, OH : ASM International, c2005.
Pynciau:
Mynediad Ar-lein:An electronic book accessible through the World Wide Web; click to view
Tagiau: Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!