ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

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书目详细资料
企业作者:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
格式:	电子会议录电子书
语言:	英语
出版:	Materials Park, OH : ASM International, c1999.
主题:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
在线阅读:	An electronic book accessible through the World Wide Web; click to view
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