ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

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Dades bibliogràfiques
Autor corporatiu:	International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format:	Electrònic Actes de congresos eBook
Idioma:	anglès
Publicat:	Materials Park, OH : ASM International, c1999.
Matèries:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Electronic books.
Accés en línia:	An electronic book accessible through the World Wide Web; click to view
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