ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi rangatōpū: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Hōputu: Tāhiko Mauhanga Hui īPukapuka
Reo:Ingarihi
I whakaputaina: Materials Park, OH : ASM International, c2001.
Ngā marau:
Urunga tuihono:An electronic book accessible through the World Wide Web; click to view
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