ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Gepubliceerd in: (2013)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Gepubliceerd in: (2008)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Gepubliceerd in: (2009)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Gepubliceerd in: (1998)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Gepubliceerd in: (2007)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Gepubliceerd in: (2002)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Gepubliceerd in: (1996)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Gepubliceerd in: (2005)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Gepubliceerd in: (2014)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Gepubliceerd in: (2004)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Gepubliceerd in: (2010)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Gepubliceerd in: (2006)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Gepubliceerd in: (2015)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Gepubliceerd in: (2012)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Gepubliceerd in: (2000)

Electronic materials science
door: Irene, Eugene A.
Gepubliceerd in: (2005)

A designer's guide to built-in self-test
door: Stroud, Charles E.
Gepubliceerd in: (2002)

Microelectronic failure analysis desk reference : 2001 supplement /
Gepubliceerd in: (2001)

Polymers for electricity and electronics materials, properties, and applications /
door: Drobny, Jiri George
Gepubliceerd in: (2012)

Parts selection and management
Gepubliceerd in: (2004)

Design for at-speed test, diagnosis, and measurement
Gepubliceerd in: (2000)

Solid state electronic devices /
door: Streetman, Ben G.
Gepubliceerd in: (2010)

Electrical characterization of organic electronic materials and devices
door: Stallinga, Peter, 1966-
Gepubliceerd in: (2009)

Microelectronic failure analysis desk reference.
Gepubliceerd in: (2002)

Microelectronics failure analysis desk reference /
Gepubliceerd in: (2011)

Single-electron devices and circuits in silicon
door: Durrani, Zahid Ali Khan
Gepubliceerd in: (2010)

Boundary-scan interconnect diagnosis
door: Sousa, José T. de
Gepubliceerd in: (2001)

Failure analysis a practical guide for manufacturers of electronic components and systems /
door: Bâzu, M. I. (Marius I.), 1948-
Gepubliceerd in: (2011)

Electronic components and processes
door: Maheshwari, Preeti
Gepubliceerd in: (2006)

Guide to state-of-the-art electron devices
Gepubliceerd in: (2013)

Novel architectures for flexible electrochemical devices and systems
door: Kawahara, Jun
Gepubliceerd in: (2013)

Electronic : devices and circuits /
door: Kulshreshtha, D. c.
Gepubliceerd in: (2006)

ESD circuits and devices /
door: Voldman, Steven H.
Gepubliceerd in: (2006)

Polymers for electronic components a Rapra industry analysis report /
door: Cousins, Keith
Gepubliceerd in: (2001)

Digital rubbish natural history of electronics /
door: Gabrys, Jennifer
Gepubliceerd in: (2011)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
door: Karris, Steven T.
Gepubliceerd in: (2012)