ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Furkejuvvon:
Bibliográfalaš dieđut
Searvvušdahkkit: International Symposium for Testing and Failure Analysis Santa Clara, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Materiálatiipa: Elektrovnnalaš Konfereansapublikašuvdna E-girji
Giella:eaŋgalasgiella
Almmustuhtton: Materials Park, OH : ASM International, c2001.
Fáttát:
Liŋkkat:An electronic book accessible through the World Wide Web; click to view
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Govvádus
Fuomášahttimat:Sponsored by EDFAS, ISTFA.
Olgguldas hápmi:xix, 485 p. : ill.
Bibliografiija:Includes bibliographical references and index.