ESD failure mechanisms and models /

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Бібліографічні деталі
Автор:	Voldman, Steven H.
Співавтор:	ebrary, Inc
Формат:	Електронний ресурс eКнига
Мова:	Англійська
Опубліковано:	Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009.
Предмети:	Semiconductors > Failures. Integrated circuits > Protection. Integrated circuits > Testing. Integrated circuits > Reliability. Electric discharges. Electrostatics. Electronic books.
Онлайн доступ:	An electronic book accessible through the World Wide Web; click to view
Теги:	Додати тег Немає тегів, Будьте першим, хто поставить тег для цього запису!

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010			\|z 2009015206
020			\|z 9780470511374 (cloth)
035			\|a (CaPaEBR)ebr10317806
035			\|a (OCoLC)441888589
040			\|a CaPaEBR \|c CaPaEBR
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082	0	4	\|a 621.381 \|2 22
100	1		\|a Voldman, Steven H.
245	1	0	\|a ESD \|h [electronic resource] : \|b failure mechanisms and models / \|c Steven H. Voldman.
246	3		\|a Electrostatic discharge
260			\|a Chichester, West Sussex, U.K. ; \|a Hoboken, NJ : \|b J. Wiley, \|c 2009.
300			\|a xxiv, 384 p.
504			\|a Includes bibliographical references and index.
533			\|a Electronic reproduction. \|b Palo Alto, Calif. : \|c ebrary, \|d 2009. \|n Available via World Wide Web. \|n Access may be limited to ebrary affiliated libraries.
650		0	\|a Semiconductors \|x Failures.
650		0	\|a Integrated circuits \|x Protection.
650		0	\|a Integrated circuits \|x Testing.
650		0	\|a Integrated circuits \|x Reliability.
650		0	\|a Electric discharges.
650		0	\|a Electrostatics.
655		7	\|a Electronic books. \|2 local
710	2		\|a ebrary, Inc.
856	4	0	\|u http://site.ebrary.com/lib/daystar/Doc?id=10317806 \|z An electronic book accessible through the World Wide Web; click to view
908			\|a 170314
942	0	0	\|c EB
999			\|c 101050 \|d 101050