Boundary-scan interconnect diagnosis

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Bibliographic Details
Main Author: Sousa, José T. de
Corporate Author: ebrary, Inc
Other Authors: Cheung, Peter Y. K.
Format: Electronic eBook
Language:English
Published: Boston : Kluwer Academic Publishers, c2001.
Series:Frontiers in electronic testing ; 18.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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010 |z  2001023211 
020 |z 0792373146 (hardcover : alk. paper) 
035 |a (CaPaEBR)ebr10067374 
035 |a (OCoLC)614723684 
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050 1 4 |a TK7870.23  |b .S64 2001eb 
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100 1 |a Sousa, José T. de. 
245 1 0 |a Boundary-scan interconnect diagnosis  |h [electronic resource] /  |c José T. de Sousa, Peter Y.K. Cheung. 
260 |a Boston :  |b Kluwer Academic Publishers,  |c c2001. 
300 |a xxi, 168 p. :  |b ill. 
490 1 |a Frontiers in electronic testing ;  |v 18 
504 |a Includes bibliographical references (p. 145-150) and index. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Boundary scan testing. 
650 0 |a Electronic apparatus and appliances  |x Testing. 
650 0 |a Electronic packaging. 
650 0 |a Electric contacts  |x Testing. 
655 7 |a Electronic books.  |2 local 
700 1 |a Cheung, Peter Y. K. 
710 2 |a ebrary, Inc. 
830 0 |a Frontiers in electronic testing ;  |v 18. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10067374  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 64701  |d 64701