Characterization of high Tc materials and devices by electron microscopy
Sábháilte in:
| Údar corparáideach: | |
|---|---|
| Rannpháirtithe: | , |
| Formáid: | Leictreonach Ríomhleabhar |
| Teanga: | Béarla |
| Foilsithe / Cruthaithe: |
Cambridge ; New York :
Cambridge University Press,
2000.
|
| Ábhair: | |
| Rochtain ar líne: | An electronic book accessible through the World Wide Web; click to view |
| Clibeanna: |
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
| Cur síos fisiciúil: | xii, 391 p. : ill. |
|---|---|
| Leabharliosta: | Includes bibliographical references. |