Characterization of high Tc materials and devices by electron microscopy
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| Autres auteurs: | , |
| Format: | Électronique e-book |
| Langue: | anglais |
| Publié: |
Cambridge ; New York :
Cambridge University Press,
2000.
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| Sujets: | |
| Accès en ligne: | An electronic book accessible through the World Wide Web; click to view |
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