Design for at-speed test, diagnosis, and measurement

Design for at-speed test, diagnosis, and measurement

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Nadeau-Dostie, Benoit
Format: Electronic eBook
Language:English
Published: Boston : Kluwer Academic, c2000.
Series:Frontiers in electronic testing.
Subjects:
Integrated circuits > Testing.
Electronic apparatus and appliances > Testing.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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MARC

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035 |a (CaPaEBR)ebr10052637 
035 |a (OCoLC)559345691 
040 |a CaPaEBR  |c CaPaEBR 
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245 0 0 |a Design for at-speed test, diagnosis, and measurement  |h [electronic resource] /  |c edited by Benoit Nadeau-Dostie. 
260 |a Boston :  |b Kluwer Academic,  |c c2000. 
300 |a xvii, 239 p. :  |b ill. 
490 1 |a Frontiers in electronic testing 
504 |a Includes bibliographical references. 
533 |a Electronic reproduction.  |b Palo Alto, Calif. :  |c ebrary,  |d 2013.  |n Available via World Wide Web.  |n Access may be limited to ebrary affiliated libraries. 
650 0 |a Integrated circuits  |x Testing. 
650 0 |a Electronic apparatus and appliances  |x Testing. 
655 7 |a Electronic books.  |2 local 
700 1 |a Nadeau-Dostie, Benoit. 
710 2 |a ebrary, Inc. 
830 0 |a Frontiers in electronic testing. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10052637  |z An electronic book accessible through the World Wide Web; click to view 
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999 |c 59648  |d 59648 

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