Design for at-speed test, diagnosis, and measurement
Sábháilte in:
| Údar corparáideach: | |
|---|---|
| Rannpháirtithe: | |
| Formáid: | Leictreonach Ríomhleabhar |
| Teanga: | Béarla |
| Foilsithe / Cruthaithe: |
Boston :
Kluwer Academic,
c2000.
|
| Sraith: | Frontiers in electronic testing.
|
| Ábhair: | |
| Rochtain ar líne: | An electronic book accessible through the World Wide Web; click to view |
| Clibeanna: |
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
MARC
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| 005 | 20171002053512.0 | ||
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| 007 | cr cn||||||||| | ||
| 008 | 990817s2000 maua sb 000 0 eng | ||
| 010 | |z 99046022 | ||
| 020 | |z 0792386698 (alk. paper) | ||
| 035 | |a (CaPaEBR)ebr10052637 | ||
| 035 | |a (OCoLC)559345691 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7874 |b .D47497 2000eb |
| 082 | 0 | 4 | |a 621.385 |2 21 |
| 245 | 0 | 0 | |a Design for at-speed test, diagnosis, and measurement |h [electronic resource] / |c edited by Benoit Nadeau-Dostie. |
| 260 | |a Boston : |b Kluwer Academic, |c c2000. | ||
| 300 | |a xvii, 239 p. : |b ill. | ||
| 490 | 1 | |a Frontiers in electronic testing | |
| 504 | |a Includes bibliographical references. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2013. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Integrated circuits |x Testing. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 700 | 1 | |a Nadeau-Dostie, Benoit. | |
| 710 | 2 | |a ebrary, Inc. | |
| 830 | 0 | |a Frontiers in electronic testing. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10052637 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 59648 |d 59648 | ||