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Applied Rasch Measurement: A Book of Exemplars Papers in Honour of John P. Keeves /

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Wedi'i Gadw mewn:
Prif Awdur: Maclean, Rupert
Awdur Corfforaethol: SpringerLink (Online service)
Awduron Eraill: Watanabe, Ryo, Baker, Robyn, Boediono, Cheng, Yin Cheong, Duncan, Wendy, Keeves, John, Mansheng, Zhou, Power, Colin, Rajput, J. S., Thaman, Konai Helu, Alagumalai, Sivakumar, Curtis, David D., Hungi, Njora
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: Dordrecht : Springer Netherlands, 2005.
Cyfres:Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4
Pynciau:
Education.
Distribution (Probability theory).
Comparative education.
Education (general).
Comparative Education.
Probability Theory and Stochastic Processes.
Mynediad Ar-lein:http://dx.doi.org/10.1007/1-4020-3076-2
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Delwedd Flaen

Applied Rasch Measurement: A Book of Exemplars Papers in Honour of John P. Keeves / gan Maclean, Rupert

Cyhoeddwyd 2005.
Cael y testun llawn
Electronig eLyfr
Ychwanegu at ffefrynnau
Wedi'i Gadw mewn:
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