Beeld op de omslag

QR code

Digital Rubbish : A Natural History of Electronics /

"This is a study of the material life of information and its devices; of electronic waste in its physical and electronic incarnations; a cultural and material mapping of the spaces where electronics in the form of both hardware and information accumulate, break down, or are stowed away. Electro...

Volledige beschrijving

Bewaard in:

Bibliografische gegevens
Hoofdauteur:	Gabrys, Jennifer
Formaat:	Elektronisch E-boek
Taal:	Engels
Gepubliceerd in:	Ann Arbor : University of Michigan Press, [2011]
Reeks:	Book collections on Project MUSE.
Onderwerpen:	Appareils electroniques hors d'usage. Electronic Waste Electronic waste Electronic apparatus and appliances SCIENCE > Environmental Science. Electronic apparatus and appliances > History. Electronic waste. History Electronic books.
Online toegang:	Full text available:
Tags:	Voeg label toe Geen labels, Wees de eerste die dit record labelt!

Gelijkaardige items

Digital rubbish natural history of electronics /
door: Gabrys, Jennifer
Gepubliceerd in: (2011)

High tech trash digital devices, hidden toxics, and human health /
door: Grossman, Elizabeth, 1957-
Gepubliceerd in: (2006)

Electronic components and processes
door: Maheshwari, Preeti
Gepubliceerd in: (2006)

Solid state electronic devices /
door: Streetman, Ben G.
Gepubliceerd in: (2010)

Guide to state-of-the-art electron devices
Gepubliceerd in: (2013)

Electronic : devices and circuits /
door: Kulshreshtha, D. c.
Gepubliceerd in: (2006)

Novel architectures for flexible electrochemical devices and systems
door: Kawahara, Jun
Gepubliceerd in: (2013)

Electronic materials science
door: Irene, Eugene A.
Gepubliceerd in: (2005)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
door: Karris, Steven T.
Gepubliceerd in: (2012)

A designer's guide to built-in self-test
door: Stroud, Charles E.
Gepubliceerd in: (2002)

Polymers for electricity and electronics materials, properties, and applications /
door: Drobny, Jiri George
Gepubliceerd in: (2012)

Hertzian tales electronic products, aesthetic experience, and critical design /
door: Dunne, Anthony
Gepubliceerd in: (2005)

Parts selection and management
Gepubliceerd in: (2004)

Electronic devices : a text and software problems manual /
door: Schultz, Mitchel E.
Gepubliceerd in: (1994)

Electrical characterization of organic electronic materials and devices
door: Stallinga, Peter, 1966-
Gepubliceerd in: (2009)

ESD basics from semiconductor manufacturing to use /
door: Voldman, Steven H.
Gepubliceerd in: (2012)

Introduction to microfabrication
door: Franssila, Sami
Gepubliceerd in: (2010)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Gepubliceerd in: (2007)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Gepubliceerd in: (2009)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Gepubliceerd in: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Gepubliceerd in: (1997)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Gepubliceerd in: (1996)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Gepubliceerd in: (2004)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Gepubliceerd in: (2002)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Gepubliceerd in: (2000)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Gepubliceerd in: (2001)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Gepubliceerd in: (2011)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Gepubliceerd in: (2010)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Gepubliceerd in: (2008)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Gepubliceerd in: (1999)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Gepubliceerd in: (1998)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Gepubliceerd in: (2003)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Gepubliceerd in: (2012)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Gepubliceerd in: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Gepubliceerd in: (2014)

Polymers for electronic components a Rapra industry analysis report /
door: Cousins, Keith
Gepubliceerd in: (2001)

EMC for product designers
door: Williams, Tim, 1954-
Gepubliceerd in: (2007)

Design for at-speed test, diagnosis, and measurement
Gepubliceerd in: (2000)

Designing the internet of things /
door: McEwen, Adrian
Gepubliceerd in: (2014)

Single-electron devices and circuits in silicon
door: Durrani, Zahid Ali Khan
Gepubliceerd in: (2010)