Strain-engineered MOSFETs /

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书目详细资料
Main Authors:	Maiti, C. K. (Author), Maiti, T. K. (Author)
格式:	电子电子书
语言:	英语
出版:	Boca Raton : CRC Press, Taylor & Francis, [2013]
主题:	Integrated circuits > Fault tolerance. Metal oxide semiconductor field-effect transistors > Reliability. Strains and stresses. Electronic books.
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