Semiconductor devices in harsh conditions /

Saved in:

Bibliographic Details
Other Authors:	Chrzanowska-Jeske, Malgorzata (Editor), Weide-Zaage, Kirsten (Editor)
Format:	Electronic eBook
Language:	English
Published:	Boca Raton : CRC Press, [2017]
Series:	Devices, circuits, and systems.
Subjects:	Semiconductors > Reliability. Extreme environments. Environmental testing.
Online Access:	Click here to view.
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

Click here to view.