Characterization, testing, measurement, and metrology /

"This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanc...

Full description

Saved in:
Bibliographic Details
Other Authors: Prakash, Chander (Editor), Singh, Sunpreet, 1989- (Editor), Davim, J. Paulo (Editor)
Format: Electronic eBook
Language:English
Published: Boca Raton, FL : CRC Press, 2021.
Edition:First edition.
Series:Manufacturing design and technology series
Subjects:
Online Access:Taylor & Francis
OCLC metadata license agreement
Tags: Add Tag
No Tags, Be the first to tag this record!