Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
Saved in:
Corporate Author: | ebrary, Inc |
---|---|
Other Authors: | Dumin, D. J. |
Format: | Electronic eBook |
Language: | English |
Published: |
[River Edge, NJ] :
World Scientific,
c2002.
|
Series: | Selected topics in electronics and systems ;
v. 23. |
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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