Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Dumin, D. J.
Format: Electronic eBook
Language:English
Published: [River Edge, NJ] : World Scientific, c2002.
Series:Selected topics in electronics and systems ; v. 23.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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