Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
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| Corporate Author: | |
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| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
[River Edge, NJ] :
World Scientific,
c2002.
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| Series: | Selected topics in electronics and systems ;
v. 23. |
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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