Power-constrained testing of VLSI circuits
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| Main Author: | |
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| Corporate Author: | |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
c2003.
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| Series: | Frontiers in electronic testing ;
22. |
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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