Nanobeam x-ray scattering : probing matter at the nanoscale /

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Bibliographic Details
Main Author: Stangl, Julian
Format: Electronic eBook
Language:English
Published: Hoboken, New Jersey : John Wiley & sons, 2013.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
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020 |a 9783527655090 (ebook) 
020 |z 9783527410774 
035 |a (CaPaEBR)ebr10762543 
035 |a (OCoLC)858655510 
040 |a CaPaEBR  |b eng  |e rda  |e pn  |c CaPaEBR 
050 1 4 |a QC482.S3  |b S82 2014eb 
082 0 4 |a 539.7222  |2 23 
100 1 |a Stangl, Julian. 
245 1 0 |a Nanobeam x-ray scattering :  |b probing matter at the nanoscale /  |c Julian Stangl [and three others]. 
264 1 |a Hoboken, New Jersey :  |b John Wiley & sons,  |c 2013. 
300 |a 1 online resource (392 pages) :  |b illustrations 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
588 |a Description based on online resource; title from PDF title page (ebrary, viewed October 6, 2013). 
590 |a Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. 
650 0 |a Electron probe microanalysis. 
650 0 |a Nanotechnology. 
650 0 |a X-rays  |x Scattering. 
655 0 |a Electronic books. 
797 2 |a ebrary. 
856 4 0 |u http://site.ebrary.com/lib/daystar/Doc?id=10762543  |z An electronic book accessible through the World Wide Web; click to view 
908 |a 170314 
942 0 0 |c EB 
999 |c 163452  |d 163452