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Reliability of MEMS testing of materials and devices /

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Detalhes bibliográficos
Autor Corporativo:	ebrary, Inc
Outros Autores:	Tabata, Osamu, Tsuchiya, Toshiyuki
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	Weinheim : Wiley-VCH, 2013.
Colecção:	Advanced micro & nanosystems.
Assuntos:	Microelectromechanical systems > Reliability. Electronic books.
Acesso em linha:	An electronic book accessible through the World Wide Web; click to view
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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