Reliability of MEMS testing of materials and devices /
保存先:
団体著者: | ebrary, Inc |
---|---|
その他の著者: | Tabata, Osamu, Tsuchiya, Toshiyuki |
フォーマット: | 電子媒体 eBook |
言語: | 英語 |
出版事項: |
Weinheim :
Wiley-VCH,
2013.
|
シリーズ: | Advanced micro & nanosystems.
|
主題: | |
オンライン・アクセス: | An electronic book accessible through the World Wide Web; click to view |
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