Reliability of MEMS testing of materials and devices /
में बचाया:
निगमित लेखक: | ebrary, Inc |
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अन्य लेखक: | Tabata, Osamu, Tsuchiya, Toshiyuki |
स्वरूप: | इलेक्ट्रोनिक ई-पुस्तक |
भाषा: | अंग्रेज़ी |
प्रकाशित: |
Weinheim :
Wiley-VCH,
2013.
|
श्रृंखला: | Advanced micro & nanosystems.
|
विषय: | |
ऑनलाइन पहुंच: | An electronic book accessible through the World Wide Web; click to view |
टैग: |
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समान संसाधन
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Reliability of MEMS testing of materials and devices /
प्रकाशित: (2013) -
Understanding MEMS : principles and applications /
द्वारा: Castañer, Luis
प्रकाशित: (2016) -
Understanding MEMS : principles and applications /
द्वारा: Castañer, Luis
प्रकाशित: (2016) -
Hermeticity testing of MEMS and microelectronic packages /
द्वारा: Costello, Suzanne, और अन्य
प्रकाशित: (2013) -
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प्रकाशित: (2013)