Reliability of MEMS testing of materials and devices /
Guardat en:
Autor corporatiu: | ebrary, Inc |
---|---|
Altres autors: | Tabata, Osamu, Tsuchiya, Toshiyuki |
Format: | Electrònic eBook |
Idioma: | anglès |
Publicat: |
Weinheim :
Wiley-VCH,
2013.
|
Col·lecció: | Advanced micro & nanosystems.
|
Matèries: | |
Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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