Patent failure how judges, bureaucrats, and lawyers put innovators at risk /

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Bibliographic Details
Main Author: Bessen, James, 1958-
Corporate Author: ebrary, Inc
Other Authors: Meurer, Michael James
Format: Electronic eBook
Language:English
Published: Princeton : Princeton University Press, c2008.
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Online Access:An electronic book accessible through the World Wide Web; click to view
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Description
Physical Description:xi, 331 p. : ill.
Bibliography:Includes bibliographical references (p. [295]-314) and index.