Transient-induced latchup in CMOS integrated circuits
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| Main Author: | |
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| Corporate Author: | |
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Singapore ; Hoboken, NJ :
Wiley,
c2009.
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| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871.99.M44 |b K47 2009eb |
| 100 | 1 | |a Ker, Ming-Dou. | |
| 245 | 1 | 0 | |a Transient-induced latchup in CMOS integrated circuits |h [electronic resource] / |c Ming-Dou Ker and Sheng-Fu Hsu. |
| 260 | |a Singapore ; |a Hoboken, NJ : |b Wiley, |c c2009. | ||
| 300 | |a xiii, 249 p. : |b ill. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Metal oxide semiconductors, Complementary |x Defects. | |
| 650 | 0 | |a Metal oxide semiconductors, Complementary |x Reliability. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 700 | 1 | |a Hsu, Sheng-Fu. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10325826 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 101675 |d 101675 | ||