Microelectronic failure analysis desk reference : 2001 supplement /
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| Corporate Authors: | , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Materials Park, OH :
ASM International,
c2001.
|
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 008 | 020606s2001 ohua sb f 001 0 eng d | ||
| 020 | |z 9780871707451 | ||
| 020 | |z 0871707454 (pbk.) | ||
| 035 | |a (CaPaEBR)ebr10320372 | ||
| 035 | |a (OCoLC)647829197 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TK7871 |b .M53 2001eb |
| 245 | 0 | 0 | |a Microelectronic failure analysis |h [electronic resource] : |b desk reference : 2001 supplement / |c prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee. |
| 260 | |a Materials Park, OH : |b ASM International, |c c2001. | ||
| 300 | |a v, 171 p. : |b ill. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Semiconductors |x Defects |v Handbooks, manuals, etc. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10320372 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 101501 |d 101501 | ||