ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
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Corporate Authors: | International Symposium for Testing and Failure Analysis San Jose, Calif., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc |
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Format: | Electronic Conference Proceeding eBook |
Language: | English |
Published: |
Materials Park, OH :
ASM International,
c2007.
|
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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