Next generation HALT and HASS : robust design of electronics and systems /
Đã lưu trong:
| Những tác giả chính: | , |
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| Định dạng: | Điện tử eBook |
| Ngôn ngữ: | Tiếng Anh |
| Được phát hành: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
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| Loạt: | Wiley series in quality and reliability engineering.
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| Những chủ đề: | |
| Truy cập trực tuyến: | An electronic book accessible through the World Wide Web; click to view |
| Các nhãn: |
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Mục lục:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.