Next generation HALT and HASS : robust design of electronics and systems /
Guardado en:
| Autores principales: | , |
|---|---|
| Formato: | Electrónico eBook |
| Lenguaje: | inglés |
| Publicado: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
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| Colección: | Wiley series in quality and reliability engineering.
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| Materias: | |
| Acceso en línea: | An electronic book accessible through the World Wide Web; click to view |
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Tabla de Contenidos:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.