Next generation HALT and HASS : robust design of electronics and systems /
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Electronisk eBog |
| Sprog: | engelsk |
| Udgivet: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
|
| Serier: | Wiley series in quality and reliability engineering.
|
| Fag: | |
| Online adgang: | An electronic book accessible through the World Wide Web; click to view |
| Tags: |
Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
|
Indholdsfortegnelse:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.