Next generation HALT and HASS : robust design of electronics and systems /
Saved in:
Main Authors: | Gray, Kirk (Author), Paschkewitz, John James (Author) |
---|---|
Format: | Electronic eBook |
Language: | English |
Published: |
Chichester, West Sussex, United Kingdom ; Hoboken, NJ :
Wiley,
2016.
|
Series: | Wiley series in quality and reliability engineering.
|
Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Next generation HALT and HASS : robust design of electronics and systems /
by: Gray, Kirk, et al.
Published: (2016) -
HALT, HASS, and HASA explained : accelerated reliability techniques /
by: McLean, Harry W., 1946-
Published: (2009) -
HALT, HASS, and HASA explained : accelerated reliability techniques /
by: McLean, Harry W., 1946-
Published: (2009) -
Accelerated testing and validation testing, engineering, and management tools for lean development /
by: Porter, Alex
Published: (2004) -
Accelerated testing and validation testing, engineering, and management tools for lean development /
by: Porter, Alex
Published: (2004)