Semiconductor terahertz technology : devices and systems at room temperature operation /

Advanced high speed devices
Опубликовано: (2010)

High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 /
Опубликовано: (2005)

THz identification for defense and security purposes identifying material, substances, and items /
по: Sokolnikov, Andre
Опубликовано: (2013)

Nanometer frequency synthesis beyond phase-locked loop
по: Xiu, Liming
Опубликовано: (2012)

An engineer's guide to automated testing of high-speed interfaces
по: Moreira, José, 1975-
Опубликовано: (2010)

Radio frequency integrated circuit design
по: Rogers, John (John W. M.)
Опубликовано: (2003)

RF CMOS power amplifiers theory, design, and implementation /
по: Hella, Mona Mostafa
Опубликовано: (2002)

Terahertz sensing technology.
Опубликовано: (2003)

Terahertz sensing technology.
Опубликовано: (2003)

CMOS circuit design for RF sensors
по: Gudnason, Gunnar
Опубликовано: (2002)

Signal integrity and radiated emission of high-speed digital systems
по: Caniggia, Spartaco
Опубликовано: (2008)

Design of analog-digital VLSI circuits for telecommunications and ... /
по: Franca, Jose E.
Опубликовано: (1994)

Ultrafast all-optical signal processing devices
Опубликовано: (2008)

Power-constrained testing of VLSI circuits
по: Nicolici, Nicola
Опубликовано: (2003)

Mosfet modeling for VLSI simulation theory and practice /
по: Arora, N. (Narain), 1943-
Опубликовано: (2007)

Mixed analog-digital VLSI devices and technology
по: Tsividis, Yannis
Опубликовано: (2002)

Compound semiconductor integrated circuits
Опубликовано: (2003)

CMOS fractional-N synthesizers design for high spectral purity and monolithic integration /
по: Muer, Bram de
Опубликовано: (2003)

VLSI test principles and architectures design for testability /
Опубликовано: (2006)

Design of multi-bit delta-sigma A/D converters
по: Geerts, Yves
Опубликовано: (2002)

System-on-chip test architectures nanometer design for testability /
Опубликовано: (2008)

VLSI circuits for biomedical applications
Опубликовано: (2008)

Materials for high-temperature semiconductor devices
Опубликовано: (1995)

Fundamentals of silicon carbide technology : growth, characterization, devices and applications /
по: Kimoto, Tsunenobu, 1963-, и др.
Опубликовано: (2014)

VLSI custom microelectronics digital, analog, and mixed-signal /
по: Hurst, S. L. (Stanley Leonard)
Опубликовано: (1999)

Breakdown phenomena in semiconductors and semiconductor devices
по: Levinshteĭn, M. E. (Mikhail Efimovich)
Опубликовано: (2005)

Verification by error modeling using testing techniques in hardware verification /
по: Radecka, Katarzyna
Опубликовано: (2003)

Diode lasers and photonic integrated circuits
по: Coldren, L. A. (Larry A.)
Опубликовано: (2012)

Wafer-level testing and test during burn-in for integrated circuits
по: Bahukudumbi, Sudarshan
Опубликовано: (2010)

Vertical 3D memory technologies /
по: Prince, Betty
Опубликовано: (2014)

ESD failure mechanisms and models /
по: Voldman, Steven H.
Опубликовано: (2009)

CMOS biomicrosystems where electronics meets biology /
Опубликовано: (2010)

Hybrid CMOS single-electron-transistor device and circuit design
по: Mahapatra, Santanu
Опубликовано: (2006)

Broadband circuits for optical fiber communication
по: Säckinger, Eduard, 1959-
Опубликовано: (2005)

Microelectronic circuit design /
по: Jaeger, Richard C.
Опубликовано: (2006)

A one-semester course in modeling of VLSI interconnections /
по: Goel, Ashok K., 1953-
Опубликовано: (2015)